A Laboratory to Supplement Courses in Process Control

Authors

  • Babu Joseph Washington University
  • Chao-Ming Ying Washington University
  • Deepak Srinivasagupta Washington University

Abstract

This article describes a set of virtual and real experiments used to supplement an undergraduate course in process control.  By integrating laboratory exercises with the course, students observe the close relationship between theory and application.  The open-ended experiments encourage creativity and allow students to explore various control system design options. MATLAB/SIMULINK is used as the primary software.  Retaining the SIMULINK interface for the laboratory experiments makes for an efficient transition from simulations.  A number of tools are provided to allow students to focus on control system synthesis and evaluation after mastering the basic concepts.

Author Biographies

Babu Joseph, Washington University

Babu Joseph is the Edward C. Dicke Professor of Chemical Engineering at Washington University. He received his BTech (1971) from the Indian Institute of Technology, Kanpur (1971), and his MS and PhD from Case Western Reserve University (in 1974 and 1975, respectively). His research interests are in the area of process engineering with emphasis on process control. He can be reached at <joseph@che.wustl.edu>.

Chao-Ming Ying, Washington University

Chao-Ming Ying graduated with a DSc in Chemical Engineering from Washington University in May of 1999. He received his BS (Honors) degree in 1993 from the Zhejiang University, Hangzhou, and his MS degree from Washington University in 1998, all in chemical engineering. He currently works at i2 Technologies in Cambridge.

Deepak Srinivasagupta, Washington University

Deepak Srinivasagupta graduated from the Indian Institute of Technology, Kharagpur, with BTech (Honors) in chemical engineering in May 1998. He is currently a doctoral student under Professor Joseph at Washington University. His research interests include polymer composites manufacturing, process control, fault detection, and process identification.

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Published

2002-01-01

Issue

Vol. 36 No. 1 (2002): Winter 2002

Section

Manuscripts