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  3. Vol. E91-D, No. 10 October 2008 /
  4. Papers

A Two-Stage Point Pattern Matching Algorithm Using Ellipse Fitting and Dual Hilbert Scans

Authors

  • Li TIAN
  • Sei-ichiro KAMATA

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Published

2008-10-01

Issue

Vol. E91-D, No. 10 October 2008

Section

Papers

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