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  3. Vol. E89-D, No. 11 November 2006 /
  4. Papers

A Per-Test Fault Diagnosis Method Based on the <I>X</I>-Fault Model

Authors

  • Xiaoqing WEN
  • Seiji KAJIHARA
  • Kohei MIYASE
  • Yuta YAMATO
  • Kewal K. SALUJA
  • Laung-Terng WANG
  • Kozo KINOSHITA

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Published

2006-11-01

Issue

Vol. E89-D, No. 11 November 2006

Section

Papers

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