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IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
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  3. Vol. E91-A, No. 12 December 2008 /
  4. Papers

A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss

Authors

  • Youhua SHI
  • Nozomu TOGAWA
  • Masao YANAGISAWA
  • Tatsuo OHTSUKI

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Published

2008-12-01

Issue

Vol. E91-A, No. 12 December 2008

Section

Papers

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