Skip to main content Skip to main navigation menu Skip to site footer
IEICE Transactions on Electronics
  • Archives
  • About
    • About the Journal
    • Submissions
    • Privacy Statement
    • Contact
Search
  • Login
  1. Home /
  2. Archives /
  3. Vol. E90-C, No. 9 September 2007 /
  4. Papers

Scalable Short-Open-Interconnect S-Parameter De-Embedding Method for On-Wafer Microwave Characterization of Silicon MOSFETs

Authors

  • Ming-Hsiang CHO
  • Yueh-Hua WANG
  • Lin-Kun WU

Downloads

  • Requires Subscription PDF

Published

2007-09-01

Issue

Vol. E90-C, No. 9 September 2007

Section

Papers

Subscription

Login to access subscriber-only resources.

The Florida OJ service is provided through the FLVC Library Services. | FLVC Privacy Policy.

More information about the publishing system, Platform and Workflow by OJS/PKP.