Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices

Authors

• Seongjae CHO
• Jang-Gn YUN
• Il Han PARK
• Jung Hoon LEE
• Jong Pil KIM
• Jong-Duk LEE
• Hyungcheol SHIN
• Byung-Gook PARK