Chip-Level Performance Improvement Using Triple Damascene Wiring Design Concept for the 0.13 µm CMOS Generation and Beyond

Authors

  • Noriaki ODA
  • Hiroyuki KUNISHIMA
  • Takashi KYOUNO
  • Kazuhiro TAKEDA
  • Tomoaki TANAKA
  • Toshiyuki TAKEWAKI
  • Masahiro IKEDA

Published

2006-11-01