Skip to main content Skip to main navigation menu Skip to site footer
IEICE Transactions on Electronics
  • Archives
  • About
    • About the Journal
    • Submissions
    • Privacy Statement
    • Contact
Search
  • Login
  1. Home /
  2. Archives /
  3. Vol. E89-C, No. 9 September 2006 /
  4. Papers

A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET

Authors

  • Takashi OHZONE
  • Kazuhiko OKADA
  • Takayuki MORISHITA
  • Kiyotaka KOMOKU
  • Toshihiro MATSUDA
  • Hideyuki IWATA

Downloads

  • Requires Subscription PDF

Published

2006-09-01

Issue

Vol. E89-C, No. 9 September 2006

Section

Papers

Subscription

Login to access subscriber-only resources.

The Florida OJ service is provided through the FLVC Library Services. | FLVC Privacy Policy.

More information about the publishing system, Platform and Workflow by OJS/PKP.