A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement

Authors

  • Ming-Hsiang CHO
  • Guo-Wei HUANG
  • Chia-Sung CHIU
  • Kun-Ming CHEN
  • An-Sam PENG
  • Yu-Min TENG

Published

2005-05-01

Issue

Section

Papers