A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission

Authors

• Toshihiro MATSUDA
• Hiroaki TAKEUCHI
• Akira MURAMATSU
• Hideyuki IWATA
• Takashi OHZONE
• Kyoji YAMASHITA
• Norio KOIKE
• Ken-ichiro TATSUUMA