Characterization of Germanium Nanocrystallites Grown on SiO<SUB>2</SUB> by a Conductive AFM Probe Technique

Authors

Katsunori MAKIHARA
Yoshihiro OKAMOTO
Hideki MURAKAMI
Seiichiro HIGASHI
Seiichi MIYAZAKI

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Published

2005-04-01

Issue

Vol. E88-C, No. 4 April 2005

Section

Papers