1/<I>f</I>-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation

Authors

• Shizunori MATSUMOTO
• Hiroaki UENO
• Satoshi HOSOKAWA
• Toshihiko KITAMURA
• Mitiko MIURA- MATTAUSCH
• Hans Jurgen MATTAUSCH
• Tatsuya OHGURO
• Shigetaka KUMASHIRO
• Tetsuya YAMAGUCHI
• Kyoji YAMASHITA
• Noriaki NAKAYAMA